Embedded diagnostics in smart instrumentation has played a role in safer, more efficient and reliable plants for decades in the process industries. As the power of the microcontrollers at the heart of these intelligent devices grows, so do the reliability, accuracy and diagnostic coverage grow.
A new whitepaper, 7 Ways to Improve Productivity and Process Operations with Pressure Instrumentation, provides practical examples of putting the accuracy, reliability, diagnostic coverage to effective use.
I’ll briefly share the seven ways and invite you to request a copy of the whitepaper. The first way is to use the diagnostic coverage to increase uptime. We shared one example how in an earlier post, Early Detection of Distillation Column Flooding Conditions.
The second way is to simplify process connections to improve reliability. Differential pressure (DP) flow and level measurement are great examples where this can be done. We discussed this in a post, Eliminating Temperature Effects in DP Level Measurement.
The third way is to eliminate heat tracing to increase accuracy and reduce costs. We described one way how in a post, Avoiding Cold Climate Measurement Challenges.
The fourth way is to easily and economically add measurement points to increase process insight. For many plants and production facilities the challenge and cost of running wires to add the measurement has been a limiting factor. As a result, measurement devices were minimized to what was needed to control the process. Wireless devices now make it possible to add measurements to improve energy usage, monitor rotating assets, and much more. Continue Reading ▶